Improvement of Organic Packaging Thermal Cycle Performance Measurement
Published: |
November 1, 2006 |
Author: |
Glenn O. Dearing, Paul J. Hart |
Abstract: |
Flip Chip Plastic Ball Grid Array (FCPBGA) modules, when subjected to extreme environmental stress testing, may often reveal mechanical and electrical failure mechanisms which may not project to the field application environment. One such test can be the Deep Thermal Cycle (DTC) environmental stress which cycles from -55°C to 125°C. This “hammer” test provides the customer with a level of security for robustness, but does not typically represent conditions which a module is likely to experience during normal handling and operation.... |
You must be a registered user to talk back to us. |
Company Information:
More articles from IBM Corporation »
- Dec 22, 2016 - Characterization, Prevention and Removal of Particulate Matter on Printed Circuit Boards
- Nov 10, 2016 - Corrosion Resistant Servers for Free-Air Cooling Data Centers
- Aug 30, 2012 - Inclusion Voiding in Gull Wing Solder Joints
- See all SMT / PCB technical articles from IBM Corporation »
More SMT / PCB assembly technical articles »
- Apr 11, 2022 - iNEMI Webinar 07.07.2021 - PCB Cleaning | ZESTRON Americas
- Jan 28, 2022 - Open Radio Unit White Box 5G | Whizz Systems
- Nov 10, 2021 - Understanding the Cleaning Process for Automatic Stencil Printers | ITW EAE
- Oct 20, 2021 - PCB Surface Finishes & The Cleaning Process - A Compatibility Study | ZESTRON Americas
- Oct 06, 2021 - Cleaning Before Conformal Coating | ZESTRON Americas
- Browse Technical Library »
Improvement of Organic Packaging Thermal Cycle Performance Measurement article has been viewed 496 times