New Era in Testing DUT over Temperature

Published:

May 13, 2016

Author:

Lior Yosef

Abstract:

The process of manufacturing and qualifying IC's consists of many steps while Temperature forcing systems play a crucial role in the final testing process. These environmental tests assure quality and reliability by stressing the device on one hand as well as helping to characterize and validate it on the other hand (making sure manufacturing outcome meets the design requirements). At later stages the temperature testing can support failure analysis effort and root cause analysis. AS common practice we are dealing with few different kinds of temperature forcing systems: Chambers, Thermal Stream systems and Direct Thermal Head systems. In this article I would like to focus on the practical aspects of utilizing Thermal Stream systems and Direct Thermal Head systems....

  • Download New Era in Testing DUT over Temperature article
  • To read this article you need to have Adobe PDF installed

November 16, 2016

Photodiodes often have built-in lenses and optical filters. If you want to know more about electronics please visit this link: http://www.win-source.net/

You must be a registered user to talk back to us.

 

Company Information:

We develop produce and supply innovative cost effective thermal control units to major Semiconductor Devices Manufacturers to test IC devices -LOW & HIGH Power devices for temp range -65°C to +200°C.

Haifa, Israel

Consultant / Service Provider, Manufacturer, Other

  • Phone +972 52 7432533

See Company Website »

Company Postings:

(4) products in the catalog

(1) technical library article

(4) news releases

  • Apr 11, 2022 - iNEMI Webinar 07.07.2021 - PCB Cleaning | ZESTRON Americas
  • Jan 28, 2022 - Open Radio Unit White Box 5G | Whizz Systems
  • Nov 10, 2021 - Understanding the Cleaning Process for Automatic Stencil Printers | ITW EAE
  • Oct 20, 2021 - PCB Surface Finishes & The Cleaning Process - A Compatibility Study | ZESTRON Americas
  • Oct 06, 2021 - Cleaning Before Conformal Coating | ZESTRON Americas
  • Browse Technical Library »

New Era in Testing DUT over Temperature article has been viewed 495 times

Reflow Oven

Global manufacturing solutions provider