Divergence in Test Results Using IPC Standard SIR and Ionic Contamination Measurements
Published: |
July 13, 2017 |
Author: |
K. Tellefsen, M. Holtzer, T. Cucu, M. Liberatore, M. Schmidt - Alpha Assembly Solutions, S. Moser, L. Henneken, P. Eckold, U. Welzel, R. Fritsch, D. Schlenker - Robert Bosch GmbH |
Abstract: |
Controlled humidity and temperature controlled surface insulation resistance (SIR) measurements of flux covered test vehicles, subject to a direct current (D.C.) bias voltage are recognized by a number of global standards organizations as the preferred method to determine if no clean solder paste and wave soldering flux residues are suitable for reliable electronic assemblies. The IPC, Japanese Industry Standard (JIS), Deutsches Institut fur Normung (DIN) and International Electrical Commission (IEC) all have industry reviewed standards using similar variations of this measurement. (...) This study will compare the results from testing two solder pastes using the IPC-J-STD-004B, IPC TM-650 2.6.3.7 surface insulation resistance test, and IPC TM-650 2.3.25 in an attempt to investigate the correlation of ROSE methods as predictors of electronic assembly electrical reliability.... |
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