Defect-Based Test: A Key Enabler for Successful Migration to structural test
Published: |
May 6, 1999 |
Author: |
Sanjay Sengupta, Sandip Kundu, Sreejit Chakravart, Praveen Parvathal, Rajesh Galivanche, George Kosonocky, Mike Rodgers, TM Mak; MPG Test Technology, Intel Corp. |
Abstract: |
ntelís traditional microprocessor test methodology, based on manually generated functional tests that are applied at speed using functional testers, is facing serious challenges due to the rising cost of manual test generation and the increasing cost of high-speed testers. If current trends continue, the cost of testing a device could exceed the cost of manufacturing it. We therefore need to rely more on automatic test pattern generation (ATPG) and low-cost structural testers.... |
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