The Quality and Reliability of Intel's Quarter Micron Process

Published:

May 7, 1999

Author:

Krishna Seshan, Timothy J. Maloney, Kenneth J. Wu

Abstract:

This paper describes how the quality and reliability of Intel's products are designed, measured, modeled, and maintained. Four main reliability topics: ESD protection, electromigration, gate oxide wearout, and the modeling and management of mechanical stresses are discussed. Based on an analysis of the reliability implications of device scaling, we show how these four topics are of prime importance to component reliability......

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Intel designs and builds the essential technologies that serve as the foundation for the world's computing devices.

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