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Microscan’s Track, Trace and Control Solution wins second industry award in 2010

Oct 28, 2010

Microscan's award-winning Track, Trace and Control Solution.

Microscan's award-winning Track, Trace and Control Solution.

RENTON, WA - Microscan, a global technology leader for track and trace solutions, announces that it has been awarded a Global Technology Award in the category of ID and Labeling for its Track, Trace and Control (TTC) Solution, developed in partnership with Cogiscan. The award was presented to the company during a Tuesday, October 26, 2010 ceremony that took place during SMTA International at the Walt Disney World Swan and Dolphin Resort in Orlando, FL.

The flexible solution features TTC middleware, which can partner with any Microscan machine vision or auto ID hardware to address plant-wide information. The TTC middleware, which is the first jointly released solution under the company’s strategic partnership agreement with Cogiscan, was also awarded a New Product Introduction (NPI) Award in the category of Software-Process Control from Circuits Assembly in Las Vegas during APEX 2010.

Microscan’s TTC middleware is specifically designed to provide work-in-progress (WIP) visibility through any factory (tracking), validate the process flow (control) and provide the history of the process steps accomplished on a product (traceability). With TTC middleware, efficient data collection is combined with error proofing to demonstrate process compliance, while reducing material and assembly costs.

Developed by experts in the electronics industry for the electronics industry, this new solution ensures that the right material is at the right place at the right time, along with the historical data to prove it. The middleware provides complete, real time data visibility across the plant floor for any and all data collection points. This can include data collected from machine vision inspections, RFID, barcode and 2D readers.

The Microscan TTC solution allows simple implementation, featuring Web-based controls and reporting, separate from the main IT plant floor network. The solution includes middleware, choice of hardware and complete visibility online for real time reporting. Connectivity to all commonly used MES and ERP systems is easily accomplished. Additionally, it features visual warnings and alarms if a product is scanned at the entry of the wrong operation or if the operation is out of sequence.

Premiering in 2005, the Global Technology Awards program is an annual celebration of product excellence in electronics surface mount assembly. Premier products based on the finest examples of creative advancement in technology are chosen by a distinguished panel of industry experts.

For more information on Microscan’s Track, Trace and Control Solutions visit http://www.microscan.com.

Microscan is a global leader in technology for precision data acquisition and control solutions serving a wide range of automation and OEM applications. Founded in 1982, Microscan has a strong history of technology innovation that includes the invention of the first laser diode barcode scanner and the 2D symbology, Data Matrix. Today, Microscan remains a technology leader in automatic identification and machine vision with extensive solutions for ID tracking, traceability and inspection ranging from basic barcode reading up to complex machine vision inspection, gauging, and measurement.

As an ISO 9001:2008 certified company recognized for quality leadership in the U.S., Microscan is known and trusted by customers worldwide as a provider of quality, high precision products. Microscan is a Spectris company. For more information, visit http://www.microscan.com.

Cogiscan is the leader in Material Control for the electronics manufacturing industry. The company offers real time tracking, traceability, and control of all materials (feeders, components, PCBs, solder paste) throughout SMT and other assembly processes. Cogiscan provides cost-effective and scalable solutions that ensure the right material is at the right place at the right time.

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