Advanced control, analysis, and reporting software includes the following features:
- Standard-less FP (fundamental parameter) methods for quantitative analysis � These include Bulk FP for metals, oxides, and resins, Thin-film FP as well as film thickness analysis
- Automatic calibration curve switching function � Recognizes different sample types
- Time-Reduction function � Sets measurement time automatically according to target precision
Optional accessories include:
- CCD sample observation camera
- Automatic collimator exchanger
- Helium purge unit
- Vacuum system for light element detection
- Automated sample changers and spinners
To learn more, please visit: http://www.ssi.shimadzu.com/MRSEDX/